Research & Development
R&D TOPICS, INTERESTS & COMPETENCES
Scanning Probe Microscopy (AFM, STM)
- Advanced Atomic Force Microscopy (roughness, grain size and periodicity analysis)
- Electrical conductivity mapping, thermal conductivity mapping
- Magnetic force microscopy
- Nanolithography
- Scanning Tunneling Microscopy
Nanostructured Materials and Surfaces
- Polymer nanocomposites
- Materials and ink characterizations for printing
- Nanoparticles, plasmonic particles, nanoparticle inks
- Thin film coatings, surface and thin film characterization
- Flexible electrodes, transparent electrodes
Coating, Printint and Processing Technologies
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- Spincoating, drop casting, spray coating, electrospinning
- Inkjet printing
- Thin film interferometry, 3D profilometry, optical microscopy
- UV, thermal, and plasma treatments
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Photovoltaics
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- Electrical probing with AM1.5 solar simulator
- Thin Film Devices (Organic Photovoltaics)
- Molecular thin layers, transparent electrodes, nano-and microstructure analysis, thin films, absorbance spectroscopy, I-V characterization
Development of Measurement Systems
- Optical, mechanical, eletromechanical and optoelectronic systems
- Demonstrator development and pilot testing
- User interface development - LabView