Services
SURFACE CHARACTERIZATION & ANALYSIS
Advanced Atomic Force Microscopy (AFM)
- Topography and phase contrast (roughness, grain size and periodicity analysis)
- Electrical conductivity
- Thermal conductivity
- Magnetic force microscopy
- Nanolithography
Electrical characterization
- 4 points probe measurements, I-V characterizations
- User interface with LabView program for measuring resistivity/conductivity, sheet resistance
- Conductivity measurement method also for soft materials
- Absorbance spectroscopy UV-vis-NIR (thermally stabilized; liquids & thin films)
- Reflectance
- Dynamic light scattering (DLS) (thermally stabilized, analysis of the true single scattering events, measurement of nanoparticle suspensions, proteins, ...)
- Raman spectroscopy
-
Film thickness measurement (range 1 nm to 70 μm),
-
refractive index n and extinction coefficient K
- Data analysis
- 3D profilometry
Materials aging and degradation tests
- Thermal, UV or plasma treatment of materials and thin films (organic and inorganic)
- AM 1.5 solar simulator
- I-V, P-V Characterization, solar cell efficiency (with temperature stabilisation)
COATING & PRINTING
Inkjet printing
- Ink-material and print testing
- Surface contact angle measurement
- Micropatterning of surfaces
- Motorized printing and coating
Functional coatings
- Spincoating, Spraycoating, Dipcoating, Solvant casting, Electrospinning,...
- Gilding, Silvering
MEASUREMENT SYSTEM DEVELOPMENT
Instrumentation developments and pilot testing
- Pilot testing of measurement systems in off-line configurations
- Adaptions to in-line applications
- Hardware control and user interface development (e.g. LabView control and data analysis)
- Collaborative projects in material engineering and materials processing