Services

SURFACE CHARACTERIZATION & ANALYSIS


Advanced Atomic Force Microscopy (AFM) 

  • Topography and phase contrast (roughness, grain size and periodicity analysis)
  • Electrical conductivity
  • Thermal conductivity
  • Magnetic force microscopy
  • Nanolithography

Electrical characterization

  • 4 points probe measurements, I-V characterizations
  • User interface with LabView program for measuring resistivity/conductivity, sheet resistance
  • Conductivity measurement method also for soft materials
Optical characterization & spectroscopy of surfaces, coatings and liquids
  • Absorbance spectroscopy UV-vis-NIR (thermally stabilized; liquids & thin films)
  • Reflectance
  • Raman spectroscopy
  • Film thickness measurement (range 1 nm to 70 μm), 
  • refractive index n and extinction coefficient K
  • Data analysis
  • 3D profilometry

Materials aging and degradation tests

  • Thermal, UV or plasma treatment of materials and thin films (organic and inorganic)
  • AM 1.5 solar simulator
  • I-V, P-V Characterization, solar cell efficiency (with temperature stabilisation)

 

COATING & PRINTING


Inkjet printing

  • Ink-material and print testing
  • Surface contact angle measurement
  • Micropatterning of surfaces 
  • Motorized printing and coating

 Functional coatings

  • Spincoating, Spraycoating, Dipcoating, Solvant casting, Electrospinning,...
  • Gilding, Silvering

 

MEASUREMENT SYSTEM DEVELOPMENT


Instrumentation developments and pilot testing

  • Pilot testing of measurement systems in off-line configurations
  • Adaptions to in-line applications
  • Hardware control and user interface development (e.g. LabView control and data analysis)
  • Collaborative projects in material engineering and materials processing
 
We provide professional contracts for all our services, supported by the Center for Innovation and Research of the HEIG-VD (School of Management & Engineering Vaud / University of Applied Sciences and Arts Western Switzerland, Yverdon-les-Bains).