Surface Nano Imaging

We perform nano- & microstructure analysis by Scanning Probe Microscopy / Atomic Force Microscopy (AFM) on metals, semiconductors, plastics or polymers, and nanocomposite materials:

  • - topography - roughness - angles of micro- and nanofacets - correlation lengths - force distance curves - adhesion force 
  • - defect characterisation on material surfaces and coatings - nanopore analysis in porous membranes
  • - conductivity mapping (electrical, thermal) - Kelvin probe microscopy - magnetic domaine mapping
  • - phase segregations in polymers and nanocomposites - molecular selfassembled structures

Example of 3D profilometry and Atomic Force Microscopy (AFM) - nanolithography:


                                        Examples: 3D profile of surface micropatterns (left); AFM image (right, nanolithography, scan size 10 μm X 10 μm).


We use 3D profilometry and Atomic Force Microscopy regularly for:

  • - R&D collaborations with industrial partners who wish to improve their products or steps in the fabrication processes based on a competent analysis of nano-and microstructures of the material's surfaces.
  • - Service for surface quality control of products (e.g. characterisation of microdefects, microscopic effects of abrasion or corrosion).
  • - R&D projects on material science research
  • - MNT training for professionals or advanced students in microtechnics or electrotechnics, materials engineering


 If you need to have a complete analysis of a surface sample, or just want to know more about this service, contact us here.